Electronics

Electron beam wafer inspection system market reaches $ 1.4 billion

The global market for E-beam wafer inspection systems was estimated at $ 459.9 million in 2020.

Global industry analysts say the global electron beam inspection system market will reach $ 1.4 billion by 2026. The electron beam wafer inspection technology is designed to operate in the 2 nm range, making it ideal for inspecting semiconductor wafers.

“By stepping up efforts to maximize throughput time, such as using multiple beams, the market for electron beam wafer inspection systems has great growth potential, as experienced by the semiconductor and electronics industries. Due to the rapid and sustainable progress that is taking place, defect management is becoming more important in today’s environment. “

The global market for electron beam wafer inspection systems is estimated at $ 459.9 million in 2020. One of the segments analyzed in the report, 10 nm and above, is projected to grow at a CAGR of 19.5% and reach $ 1.1 billion until the end of the analysis period. After a thorough analysis of the business impact of the pandemic and the economic crisis it caused, growth in the 1-10 Nm segment will be readjusted to a revised CAGR of 20.2% over the next seven years.

This segment currently holds a 22.3% share of the global electron beam wafer inspection system market. Electrobeam wafer inspection with resolutions above 10 nm extends the inspection system with the flexibility, sensitivity, and production-appropriate performance required for in-line monitoring of product wafers above 10 nm nodes.

Electron beam wafer inspection with a resolution of 1 to 10 nm provides excellent reliability when scaling transistors to 10 nm. The transition to 10nm nodes presents many challenges and fatal flaws are the main concern. Wafer defect detection is becoming more complex and expensive at each node and remains very difficult at 10nm. Electro-beam wafer inspection extends a reliable model that guarantees perfect detection of defects.

Segments below 1 nm will reach $ 100 million by 2026

Electron beam hotspot inspection tools with a resolution of less than 1 nm can detect the most difficult defects not noticed by other technologies. Supporting 1nm resolution, electron beam inspection systems are extremely useful for research and development, lamp and production control of multiple patterning, 3D NAND, DRAM, and FinFET forming applications.

In the less than 1 nm segment of the world, the United States, Canada, Japan, China, and Europe drive an estimated 22% CAGR in this segment. With a total market size of $ 14.9 million in 2020, these regional markets are projected to reach $ 60 million by the end of the analysis period. China continues to be one of the fastest growing countries in this regional market cluster. The Asia-Pacific market, led by countries such as Australia, India and South Korea, is projected to reach US $ 38.6 million by 2026.



https://www.electronicsb2b.com/headlines/e-beam-wafer-inspection-systems-market-to-reach-1-4-billion/ Electron beam wafer inspection system market reaches $ 1.4 billion

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